User Contributed MET/CAL PROCEDURE ============================================================================= INSTRUMENT: Keithley 196:(90 day) CAL VER IEEE DATE: 13-Sep-93 AUTHOR: User Contributed REVISION: 1.0 ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 38 NUMBER OF LINES: 230 CONFIGURATION: Fluke 5700A CONFIGURATION: Fluke 5725A ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON # This procedure is based on the verification procedure in the Instruction # manual for the Keithley Model 196 DMM dated JANUARY 1988. 1.001 ASK- R Q N P F W 1.002 HEAD PRELIMINARY INSTRUCTIONS 1.003 DISP Allow the Keithley 196 to stabilize in an environment 1.003 DISP with ambient temperature of 18 to 28C and relative 1.003 DISP humidity of less than 80%. 1.003 DISP Then turn the Keithley 196 on, and allow it to warm up 1.003 DISP for at least 2 hours. 1.003 DISP Connect the UUT to IEEE Port 1. 1.004 DISP [32] Connect the 5700A and the UUT as follows. 1.004 DISP [32][27][91]1m 5700A TO 197 1.004 DISP [32] OUTPUT V ê A HI ÄÄÄÄÄÄÄÄÄ VOLTS/OHMS INPUT HI 1.004 DISP [32] OUTPUT V ê A LO ÄÄÄÄÄÄÄÄÄ VOLTS/OHMS INPUT LO 1.004 DISP [32] SENSE V ê HI ÄÄÄÄÄÄÄÄÄÄÄ OHMS SENSE HI 1.004 DISP [32] SENSE V ê HI ÄÄÄÄÄÄÄÄÄÄÄ OHMS SENSE LO 1.005 HEAD {DC VOLTS PERFORMANCE VERIFICATION} 1.006 RNG V 1.007 IEEE [SDC] 1.008 IEEE J0 1.009 IEEE F0R1S2X 1.010 5700 0V S 2W 1.011 IEEE Z1X 1.012 IEEE [I][I] 1.013 MEMC 300 mV 0.00000193U # T.U.R. AT 0V IS 2.7 . WITH GUARDBAND FACTOR ADJUSTMENTS COMES TO 2.57 # FACTOR IS .965 WICH BRINGS THE TEST LIMITS BACK 4:1. # TEST TOL WAS 0.000002U. 2.001 IEEE F0R1Z0S2X 2.002 5700 300mV S 2W 2.003 IEEE [I][I] 2.004 MATH MEM = MEM * 1000 2.005 MEME 2.006 MEMC 300 mV 0.026U 3.001 IEEE F0R2S2X 3.002 5700 3V S 2W 3.003 IEEE [I][I] 3.004 MEME 3.005 MEMC 3 V 0.00013U 4.001 IEEE F0R3S2X 4.002 5700 30V S 2W 4.003 IEEE [I][I] 4.004 MEME 4.005 MEMC 30 V 0.0027U 5.001 IEEE F0R4S2X 5.002 5700 300V S 2W 5.003 IEEE [I][I] 5.004 MEME 5.005 MEMC 300 V 0.030U 6.001 5700 * S 6.002 HEAD {AC VOLTS PERFORMANCE VERIFICATION} 6.003 RNG V AC 6.004 IEEE F1R1S2X 6.005 5700 290mV 20H S 2W 6.006 IEEE [I][I] 6.007 MATH MEM = MEM * 1000 6.008 MEME 6.009 MEMC 300 mV 5.9U 20H 7.001 5700 290mV 50H S 2W 7.002 IEEE [I][I] 7.003 MATH MEM = MEM * 1000 7.004 MEME 7.005 MEMC 300 mV 0.97U 50H 8.001 5700 290mV 200H S 2W 8.002 IEEE [I][I] 8.003 MATH MEM = MEM * 1000 8.004 MEME 8.005 MEMC 300 mV 0.535U 200H 9.001 5700 290mV 10kH S 2W 9.002 IEEE [I][I] 9.003 MATH MEM = MEM * 1000 9.004 MEME 9.005 MEMC 300 mV 0.535U 10KH 10.001 5700 290mV 20kH S 2W 10.002 IEEE [I][I] 10.003 MATH MEM = MEM * 1000 10.004 MEME 10.005 MEMC 300 mV 1.36U 20KH 11.001 5700 290mV 100kH S 2W 11.002 IEEE [I][I] 11.003 MATH MEM = MEM * 1000 11.004 MEME 11.005 MEMC 300 mV 6.1U 100KH 12.001 IEEE F1R2S2X 12.002 5700 2.9V 20H S 2W 12.003 IEEE [I][I] 12.004 MEME 12.005 MEMC 3 V 0.059U 20H 13.001 5700 2.9V 50H S 2W 13.002 IEEE [I][I] 13.003 MEME 13.004 MEMC 3 V 0.0097U 50H 14.001 5700 2.9V 200H S 2W 14.002 IEEE [I][I] 14.003 MEME 14.004 MEMC 3 V 0.00535U 200H 15.001 5700 2.9V 10kH S 2W 15.002 IEEE [I][I] 15.003 MEME 15.004 MEMC 3 V 0.00535U 10kH 16.001 5700 2.9V 20kH S 2W 16.002 IEEE [I][I] 16.003 MEME 16.004 MEMC 3 V 0.0107U 20kH 17.001 5700 2.9V 100kH S 2W 17.002 IEEE [I][I] 17.003 MEME 17.004 MEMC 3 V 0.0465U 100KH 18.001 IEEE F1R3S2X 18.002 5700 29V 20H S 2W 18.003 IEEE [I][I] 18.004 MEME 18.005 MEMC 30 V 0.59U 20H 19.001 5700 29V 50H S 2W 19.002 IEEE [I][I] 19.003 MEME 19.004 MEMC 30 V 0.097U 50H 20.001 5700 29V 200H S 2W 20.002 IEEE [I][I] 20.003 MEME 20.004 MEMC 30 V 0.0535U 200H 21.001 5700 29V 10kH S 2W 21.002 IEEE [I][I] 21.003 MEME 21.004 MEMC 30 V 0.0535U 10kH 22.001 5700 29V 20kH S 2W 22.002 IEEE [I][I] 22.003 MEME 22.004 MEMC 30 V 0.136U 20kH 23.001 5700 29V 100kH S 2W 23.002 IEEE [I][I] 23.003 MEME 23.004 MEMC 30 V 0.465U 100KH 24.001 IEEE F1R4S2X 24.002 5700 200V 20H S 2W 24.003 IEEE [I][I] 24.004 MEME 24.005 MEMC 300 V 4.1U 20H 25.001 5700 290V 50H S 2W 25.002 IEEE [I][I] 25.003 MEME 25.004 MEMC 300 V 0.97U 50H 26.001 5700 290V 200H S 2W 26.002 IEEE [I][I] 26.003 MEME 26.004 MEMC 300 V 0.535U 200H 27.001 5700 290V 10kH B1 S 2W 27.002 IEEE [I][I] 27.003 MEME 27.004 MEMC 300 V 0.535U 10KH 28.001 5700 290V 20kH B1 S 2W 28.002 IEEE [I][I] 28.003 MEME 28.004 MEMC 300 V 1.36U 20KH 29.001 5700 100V 100kH S 2W 29.002 IEEE [I][I] 29.003 MEME 29.004 MEMC 300 V 1.8U 100KH 30.001 5700 * S 30.002 HEAD {OHMS PERFORMANCE VERIFICATION} 30.003 RNG Z 30.004 IEEE F2R1S2X 30.005 5700 0Z S 4W 30.006 IEEE Z1X 30.007 IEEE [I][I] 30.008 MEME 30.009 MEMC 300 Z 0.001U 31.001 IEEE F2R1S2Z0X 31.002 5700 190Z S 4W 31.003 IEEE [I][I] 31.004 MEME 31.005 MEMC 300 Z 0.021U 32.001 IEEE F2R2S2Z0X 32.002 5700 1.9kZ S 4W 32.003 IEEE [I][I] 32.004 MATH MEM = MEM / 1000 32.005 MEME 32.006 MEMC 3 KZ 0.00015U 33.001 IEEE F2R3S2Z0X 33.002 5700 19kZ S 4W 33.003 IEEE [I][I] 33.004 MATH MEM = MEM / 1000 33.005 MEME 33.006 MEMC 30 KZ 0.0015U 34.001 IEEE F2R4S2Z0X 34.002 5700 190kZ S 4W 34.003 IEEE [I][I] 34.004 MATH MEM = MEM / 1000 34.005 MEME 34.006 MEMC 300 kZ 0.042U 35.001 IEEE F2R5S2Z0X 35.002 5700 1.9MZ S 4W 35.003 IEEE [I][I] 35.004 MATH MEM = MEM / 1000000 35.005 MEME 35.006 MEMC 3 MZ 0.00042U 36.001 IEEE F2R6S2Z0X 36.002 5700 19MZ S 4W 36.003 IEEE [I][I] 36.004 MATH MEM = MEM / 1000000 36.005 MEME 36.006 MEMC 30 MZ 0.0192U 37.001 IEEE F2R7Z0S2X 37.002 5700 100MZ S 2W 37.003 IEEE [I][I] 37.004 MATH MEM = MEM / 1000000 37.005 MEME 37.006 MEMC 300 MZ 2.002U 38.001 5700 * S 38.002 RNG A 38.003 CALL Sub Keithley 196 DC/AC Amps (90 day) CAL VER IEEE 38.004 IEEE [SDC] 38.005 HEAD {NOTIFICATION OF T.U.R.'s AND GUARDBAND FACTORS USED} 38.006 DISP MEASUREMENTS TAKEN WITH A RATIO SMALLER THAN 4:1 38.006 DISP T.U.R. HAVE GUARDBAND FACTORS APLIED TO THE TEST LIMITS. 38.007 DISP {Calibration Complete} 38.008 END